Mathematics & Physics 2017, 10(1), 40–44 УДК 517.9 The Characteristics of Observation of the Non-uniform Magnetization on the Surface of the Thin Magnetic Films in Ta/CoFeB/MgO/CoFeB/Ta Multilayers Nikolay A.Djuzhev Anatoly F.Popkov Maksim A.Makhiboroda Gleb D.Demin Aleksandr M.Kozmin Maksim Y. Chinenkov∗ National Research University of Electronic Technology (MIET) Shokina sq., bld. 1, Moscow, Zelenograd, 124498 Russia Received 20.08.2016, received in revised form 10.10.2016, accepted 14.11.2016 This work presents the results of the study of non-uniformly magnetized regions on the surface of thin magnetic films in multilayer magnetic tunnel junction (MTJ) structure Ta/CoFeB/MgO/CoFeB/Ta observed by highly sensitive magnetic force microscopy (MFM) probes. <...> The micromagnetic simulation of the magnetization dynamics in CoFeB magnetic layer after the application of the external magnetic field of 0.5 T is conducted using mumax3 open-source software. <...> The areas of the existence of magnetic vortices and domain walls in CoFeB magnetic film are found where the domain wall thickness was measured by MFM in the nanometer scale. <...> Keywords: magnetic force microscopy, thin magnetic films, magnetic domains, magnetic tunnel junction. <...> Introduction Despite the fact that the scanning probe microscopy (SPM) has the broadest range of applications in many modern studies, the method of dynamic MFM is currently used for imaging of magnetic fields linear dimensions greatly exceed the nanometer scale. <...> The impossibility of applying an external magnetic field to rearrange the domain walls on the sample surface during MFM imaging also remains an obstacle to the transition in the nanometer range of magnetic measurements. 1. <...> The experimental technique The constant magnetic field was applied to the test sample of multilayer thin-film MTJ structure Ta/CoFeB/MgO/CoFeB/Ta for the detection and study of the gradient of magnetic ∗chinenkov@inbox.ru ⃝ Siberian Federal University. <...> The Characteristics of Observation of the Non-uniform Magnetization . . . force on its surface. <...> In the process of MFM measurements on the submicron level, it is necessary to separate the magnetic image from the topography of the sample. <...> During the second pass the cantilever oscillating at the resonant frequency was used for the detecting the magnetic field <...>