Национальный цифровой ресурс Руконт - межотраслевая электронная библиотека (ЭБС) на базе технологии Контекстум (всего произведений: 634655)
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Проблемы машиностроения и автоматизации  / №1 2012

PLANNING RELIABILITY TESTING OF TECHNOLOGICAL SYSTEMS VIA PRODUCTIVITY CRITERION (286,00 руб.)

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Первый авторPapich Ljubisa
АвторыJoseph Aronov
Страниц6
ID434459
АннотацияThis paper considers developing reliability estimate testing plans for technological systems. It is well recognized that the loss of technological system productivity is mainly caused by item fails or fluctuations of final product quality level. The relation between Pr and Pn is shown by technological system availability. A new statistical model for testing technological system duration, based on initial criterion for obtaining required availability, is developed. Secondly, a new testing plan is developed for the estimate availability of technological system, for the case of exponential distribution time of state of functioning and failure. The initial testing parameters which were considered included: error of availability estimate, confidence probability level, and distribution of time of state of functioning and failure. The testing duration is calculated by the number of failures in the course of testing of the technological system. In the case of exponential distribution of time of state of functioning and failure, the general testing plan for reliability estimate of technological system is obtained by varying the testing plan initial parameters’ values.
УДК621.9.04
Papich, L. PLANNING RELIABILITY TESTING OF TECHNOLOGICAL SYSTEMS VIA PRODUCTIVITY CRITERION / L. Papich, Aronov Joseph // Проблемы машиностроения и автоматизации .— 2012 .— №1 .— С. 171-176 .— URL: https://rucont.ru/efd/434459 (дата обращения: 24.04.2024)

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ПРОГРЕССИВНЫЕ ТЕХНОЛОГИИ В МАШИНОСТРОЕНИИ THE ADVANCED TECHNOLOGIES IN MECHANICAL ENGINEERING UDC 621.9.04 © Ljubisa Papich, Joseph Aronov PLANNING RELIABILITY TESTING OF TECHNOLOGICAL SYSTEMS VIA PRODUCTIVITY CRITERION logical system duration, based on initial criterion for obtaining required availability, is developed. <...> Secondly, a new testing plan is developed for the estimate availability of technological system, for the case of exponential distribution time of state of functioning and failure. <...> The initial testing parameters which were considered included: error of availability estimate, confidence probability level, and distribution of time of state of functioning and failure. <...> In the case of exponential distribution of time of state of functioning and failure, the general testing plan for reliability estimate of technological system is obtained by varying the testing plan initial parameters’ values. <...> Keywords: reliability, productivity, availability, test-plan, exponential distribution, technological system. the loss of technological system productivity is mainly caused by item fails or fluctuations of final product quality level. <...> For example, a recent paper describes a reliability test plan for a series system such that its i is a r.v. having a uniform distribution [4]. 1 This paper presents possible choices of general testing plan for technological systems reliability estimation. <...> PROBLEM FORMULATION Loss of productivity of technological systems, throughout the course of operation, can occur as a result of failures (TS’s items) or changes in final product quality requirements. <...> A new statistical model for testing techno(1) Assigned value for K* could be considered as a separate issues. <...> Decreasing reliability level is the result of item failures at discrete moments t1 placed items. <...> In order not to go below minimum allowed productivity level, N1 items are removed/replaced, and partially restored technological system reliability level R1 is obtained. <...> Due to decreasing reliability levels of other items, the restored reliability level of technological system is smaller than value R=1. <...> Paradoxes of shortened testings der to fulfill statistical requirements. <...> It should be noted that from the aspect of the statistical decision rule2 , this approach may be regarded as incorrect, not statistically reliable, for random values of and/or [7 <...>