Национальный цифровой ресурс Руконт - межотраслевая электронная библиотека (ЭБС) на базе технологии Контекстум (всего произведений: 634620)
Контекстум
.
Электросвязь  / №7 2015

COMPLETED SOLUTION FOR RADIATION-HARDENED BMTI FPGA SYSTEM IN AEROSPACE APPLICATION (250,00 руб.)

0   0
Первый авторYuanfu Zhao
АвторыLei Chen, Xuewu Li, Changlei Feng, Shuo Wang
Страниц4
ID419963
АннотацияThe single event effects such as SEU/SET will cause dysfunction to FPGA which work in space radiation environment. This paper focuses on the SEU effects of SRAM-based FPGA and mitigation techniques. A completed solution based on radiation-hardened FPGA and intelligent scrubbing chips produced by Beijing Microelectronics Technology Institute (BMTI) is constructed. To evaluate effectiveness of the solution, a verification test is designed and heavy ion irradiation test is carried out.
УДК621.383.8+004.932
COMPLETED SOLUTION FOR RADIATION-HARDENED BMTI FPGA SYSTEM IN AEROSPACE APPLICATION / Z. Yuanfu [и др.] // Электросвязь .— 2015 .— №7 .— С. 59-62 .— URL: https://rucont.ru/efd/419963 (дата обращения: 19.04.2024)

Предпросмотр (выдержки из произведения)

ISSN 0013-5771. «ЭЛЕКТРОСВЯЗЬ», № 7, 2015 УДК 621.383.8+004.932 COMPLETED SOLUTION FOR RADIATION-HARDENED BMTI FPGA SYSTEM IN AEROSPACE APPLICATION Zhao Yuanfu, Director of Beijing Microelectronics Technology Institute (BMTI), Ph.D.; Http://www.bmti.com.cn Chen Lei, Assistant Director of BMTI, Ph.D. Li Xuewu, Manager of FPGA department in BMTI, Ph.D. Feng Changlei, Hardware leader of FPGA department in BMTI, Dipl.-Ing. <...> Wang Shuo, Software leader of FPGA department in BMTI, Dipl.-Ing. 59 The single event effects such as SEU/SET will cause dysfunction to FPGA which work in space radiation environment. <...> This paper focuses on the SEU effects of SRAM-based FPGA and mitigation techniques. <...> A completed solution based on radiation-hardened FPGA and intelligent scrubbing chips produced by Beijing Microelectronics Technology Institute (BMTI) is constructed. <...> However, the exposed problem, that SRAMbased FPGA is susceptible to Single Event Effects (SEE), has caused wide attention of the FPGA research institutes and users. <...> In order to ease the Single Event Upset (SEU) effects occurred in SRAM-based FPGA, such measures usually can be used. <...> One way is to use the anti-SEU FPGA, such as anti-fuse FPGA product, but which can be limited in large scale application due to the embargo and price issues. <...> The other way is to choose the anti-SEU SRAM-based FPGA. <...> Another way is to apply the mitigation techniques to FPGA, such as configuration memory scrubbing technique [2–4], Triple Modular Redundancy (TMR) technique [5] and so on. <...> Especially, the configuration memory scrubbing technique can avoid the system failure caused by SEU effects in theory. <...> The SEU effects mitigation technique, in SRAM-based FPGA application, needs to analyze according to the development of the specific task. <...> Xilinx provides a matrix analysis chart as a basis for selection, as shown in Fig 1. <...> This paper introduces a completed solution based on the SEE-hardened SRAM-based FPGA and general intelligent scrubbing control chip for long term on orbit spacecraft electronic system. <...> Besides, the ground radiation verification experiment has been carried out to prove the effectiveness of the solution we proposed. <...> The general <...>

Облако ключевых слов *


* - вычисляется автоматически
.
.